Zhen Chen, Tangbin Xia, Yanting Li, Ershun Pan. Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning. IEEE Transactions on Reliability, 69(3):887-902, 2020. [doi]
@article{ChenXLP20,
title = {Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning},
author = {Zhen Chen and Tangbin Xia and Yanting Li and Ershun Pan},
year = {2020},
doi = {10.1109/TR.2019.2955596},
url = {https://doi.org/10.1109/TR.2019.2955596},
researchr = {https://researchr.org/publication/ChenXLP20},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {69},
number = {3},
pages = {887-902},
}