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Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning

Zhen Chen, Tangbin Xia, Yanting Li, Ershun Pan. Tweedie Exponential Dispersion Processes for Degradation Modeling, Prognostic, and Accelerated Degradation Test Planning. IEEE Transactions on Reliability, 69(3):887-902, 2020. [doi]

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