A detectability analysis of fault classes for Boolean specifications - researchr publication authors

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Zhenyu Chen, Baowen Xu, Changhai Nie. A detectability analysis of fault classes for Boolean specifications. In Roger L. Wainwright, Hisham Haddad, editors, Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008. pages 826-830, ACM, 2008. [doi]

This author has not been identified. Look up 'Zhenyu Chen' in GoogleThis author has not been identified. Look up 'Baowen Xu' in GoogleThis author has not been identified. Look up 'Changhai Nie' in Google

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