Zhenyu Chen, Baowen Xu, Changhai Nie. A detectability analysis of fault classes for Boolean specifications. In Roger L. Wainwright, Hisham Haddad, editors, Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008. pages 826-830, ACM, 2008. [doi]
@inproceedings{ChenXN08,
title = {A detectability analysis of fault classes for Boolean specifications},
author = {Zhenyu Chen and Baowen Xu and Changhai Nie},
year = {2008},
doi = {10.1145/1363686.1363874},
url = {http://doi.acm.org/10.1145/1363686.1363874},
tags = {analysis},
researchr = {https://researchr.org/publication/ChenXN08},
cites = {0},
citedby = {0},
pages = {826-830},
booktitle = {Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008},
editor = {Roger L. Wainwright and Hisham Haddad},
publisher = {ACM},
isbn = {978-1-59593-753-7},
}