Zhenyu Chen, Baowen Xu, Changhai Nie. A detectability analysis of fault classes for Boolean specifications. In Roger L. Wainwright, Hisham Haddad, editors, Proceedings of the 2008 ACM Symposium on Applied Computing (SAC), Fortaleza, Ceara, Brazil, March 16-20, 2008. pages 826-830, ACM, 2008. [doi]
No reviews for this publication, yet.