Morphology-Retained Non-Linear Image Registration of Serial Electron Microscopy Sections - researchr publication authors

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Xi Chen, Qiwei Xie, Lijun Shen, Hua Han. Morphology-Retained Non-Linear Image Registration of Serial Electron Microscopy Sections. In 2018 IEEE International Conference on Image Processing, ICIP 2018, Athens, Greece, October 7-10, 2018. pages 3833-3837, IEEE, 2018. [doi]

This author has not been identified. Look up 'Xi Chen' in GoogleThis author has not been identified. Look up 'Qiwei Xie' in GoogleThis author has not been identified. Look up 'Lijun Shen' in GoogleThis author has not been identified. Look up 'Hua Han' in Google

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