Xi Chen, Qiwei Xie, Lijun Shen, Hua Han. Morphology-Retained Non-Linear Image Registration of Serial Electron Microscopy Sections. In 2018 IEEE International Conference on Image Processing, ICIP 2018, Athens, Greece, October 7-10, 2018. pages 3833-3837, IEEE, 2018. [doi]
Abstract is missing.