Xi Chen, Qiwei Xie, Lijun Shen, Hua Han. Morphology-Retained Non-Linear Image Registration of Serial Electron Microscopy Sections. In 2018 IEEE International Conference on Image Processing, ICIP 2018, Athens, Greece, October 7-10, 2018. pages 3833-3837, IEEE, 2018. [doi]
@inproceedings{ChenXSH18,
title = {Morphology-Retained Non-Linear Image Registration of Serial Electron Microscopy Sections},
author = {Xi Chen and Qiwei Xie and Lijun Shen and Hua Han},
year = {2018},
doi = {10.1109/ICIP.2018.8451280},
url = {https://doi.org/10.1109/ICIP.2018.8451280},
researchr = {https://researchr.org/publication/ChenXSH18},
cites = {0},
citedby = {0},
pages = {3833-3837},
booktitle = {2018 IEEE International Conference on Image Processing, ICIP 2018, Athens, Greece, October 7-10, 2018},
publisher = {IEEE},
isbn = {978-1-4799-7061-2},
}