Zhen Chen, Dong Xiang, Boxue Yin. The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 146-151, IEEE Computer Society, 2009. [doi]
Abstract is missing.