Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits - researchr publication authors

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Shih-Hung Chen, Chih-Ting Yeh. Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 57-60, IEEE, 2008. [doi]

This author has not been identified. Look up 'Shih-Hung Chen' in GoogleThis author has not been identified. Look up 'Chih-Ting Yeh' in Google

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