Shih-Hung Chen, Chih-Ting Yeh. Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 57-60, IEEE, 2008. [doi]
@inproceedings{ChenY08-8,
title = {Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits},
author = {Shih-Hung Chen and Chih-Ting Yeh},
year = {2008},
doi = {10.1109/APCCAS.2008.4745959},
url = {http://dx.doi.org/10.1109/APCCAS.2008.4745959},
researchr = {https://researchr.org/publication/ChenY08-8},
cites = {0},
citedby = {0},
pages = {57-60},
booktitle = {IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008},
publisher = {IEEE},
}