Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang. Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{ChenYLCH21,
title = {Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors},
author = {Kai-Hsun Chen and Bo-Yi Yang and Jia-Ruei Liang and Hung-Lin Chen and Jiun-Lang Huang},
year = {2021},
doi = {10.1109/ITC-Asia53059.2021.9808811},
url = {https://doi.org/10.1109/ITC-Asia53059.2021.9808811},
researchr = {https://researchr.org/publication/ChenYLCH21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1334-3},
}