Kai-Hsun Chen, Bo-Yi Yang, Jia-Ruei Liang, Hung-Lin Chen, Jiun-Lang Huang. Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.