Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi. Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-9, IEEE Computer Society, 2013. [doi]
Abstract is missing.