CNN-based Stochastic Regression for IDDQ Outlier Identification

Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao. CNN-based Stochastic Regression for IDDQ Outlier Identification. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Chun-Teng Chen

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Chia-Heng Yen

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Cheng-Yen Wen

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Cheng-Hao Yang

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Kai-Chiang Wu

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Mason Chern

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Ying-Yen Chen

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Chun-Yi Kuo

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Jih-Nung Lee

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Shu-Yi Kao

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Mango Chia-Tso Chao

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