Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao. CNN-based Stochastic Regression for IDDQ Outlier Identification. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{ChenYWYWCCKLKC20,
title = {CNN-based Stochastic Regression for IDDQ Outlier Identification},
author = {Chun-Teng Chen and Chia-Heng Yen and Cheng-Yen Wen and Cheng-Hao Yang and Kai-Chiang Wu and Mason Chern and Ying-Yen Chen and Chun-Yi Kuo and Jih-Nung Lee and Shu-Yi Kao and Mango Chia-Tso Chao},
year = {2020},
doi = {10.1109/VTS48691.2020.9107570},
url = {https://doi.org/10.1109/VTS48691.2020.9107570},
researchr = {https://researchr.org/publication/ChenYWYWCCKLKC20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5359-9},
}