Evaluation of Cyanoethyl Pullulan material as the dielectric layer for EWOD devices

Jianfeng Chen, Yuhua Yu, Xiangyu Zeng, Jian Li, Jia Zhou. Evaluation of Cyanoethyl Pullulan material as the dielectric layer for EWOD devices. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.