Peng Chen 0022, Jun Yin 0001, Feifei Zhang, Pui-In Mak, Rui Paulo Martins, Robert Bogdan Staszewski. Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap., 69(1):196-206, 2022. [doi]
Abstract is missing.