Wafer map failure pattern recognition based on deep convolutional neural network - researchr publication authors

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Shouhong Chen, Yuxuan Zhang, Xingna Hou, Yuling Shang, Ping Yang. Wafer map failure pattern recognition based on deep convolutional neural network. Expert Syst. Appl., 209:118254, 2022. [doi]

This author has not been identified. Look up 'Shouhong Chen' in GoogleThis author has not been identified. Look up 'Yuxuan Zhang' in GoogleThis author has not been identified. Look up 'Xingna Hou' in GoogleThis author has not been identified. Look up 'Yuling Shang' in GoogleThis author has not been identified. Look up 'Ping Yang' in Google

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