Shouhong Chen, Yuxuan Zhang, Xingna Hou, Yuling Shang, Ping Yang. Wafer map failure pattern recognition based on deep convolutional neural network. Expert Syst. Appl., 209:118254, 2022. [doi]
@article{ChenZHSY22,
title = {Wafer map failure pattern recognition based on deep convolutional neural network},
author = {Shouhong Chen and Yuxuan Zhang and Xingna Hou and Yuling Shang and Ping Yang},
year = {2022},
doi = {10.1016/j.eswa.2022.118254},
url = {https://doi.org/10.1016/j.eswa.2022.118254},
researchr = {https://researchr.org/publication/ChenZHSY22},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {209},
pages = {118254},
}