Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Shouhong Chen, Yuxuan Zhang, Xingna Hou, Yuling Shang, Ping Yang. Wafer map failure pattern recognition based on deep convolutional neural network. Expert Syst. Appl., 209:118254, 2022. [doi]
Abstract is missing.