Min Chen, Wei Zhao, Frank Liu, Yu Cao. Fast statistical circuit analysis with finite-point based transistor model. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1391-1396, ACM, 2007. [doi]
Abstract is missing.