Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping - researchr publication authors

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D. J. Cheney, R. Deist, B. P. Gila, J. Navales, Fan Ren, S. J. Pearton. Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping. Microelectronics Reliability, 52(12):2884-2888, 2012. [doi]

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