D. J. Cheney, R. Deist, B. P. Gila, J. Navales, Fan Ren, S. J. Pearton. Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping. Microelectronics Reliability, 52(12):2884-2888, 2012. [doi]
@article{CheneyDGNRP12,
title = {Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping},
author = {D. J. Cheney and R. Deist and B. P. Gila and J. Navales and Fan Ren and S. J. Pearton},
year = {2012},
doi = {10.1016/j.microrel.2012.08.018},
url = {http://dx.doi.org/10.1016/j.microrel.2012.08.018},
researchr = {https://researchr.org/publication/CheneyDGNRP12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {12},
pages = {2884-2888},
}