Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping

D. J. Cheney, R. Deist, B. P. Gila, J. Navales, Fan Ren, S. J. Pearton. Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping. Microelectronics Reliability, 52(12):2884-2888, 2012. [doi]

Abstract

Abstract is missing.