Kwang-Ting Cheng. Test generation for delay faults in non-scan and partial scan sequential circuits. In ICCAD. pages 554-559, 1992. [doi]
@inproceedings{Cheng92:0,
title = {Test generation for delay faults in non-scan and partial scan sequential circuits},
author = {Kwang-Ting Cheng},
year = {1992},
doi = {10.1145/304032.304167},
url = {http://doi.acm.org/10.1145/304032.304167},
tags = {testing},
researchr = {https://researchr.org/publication/Cheng92%3A0},
cites = {0},
citedby = {0},
pages = {554-559},
booktitle = {ICCAD},
}