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Kwang-Ting Cheng. Test generation for delay faults in non-scan and partial scan sequential circuits. In ICCAD. pages 554-559, 1992. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential CircuitsKwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer. itc 1991: 403-410
The following publications are possibly variants of this publication: