Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer. A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 403-410, IEEE Computer Society, 1991.
Abstract is missing.