A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits - researchr publication authors

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Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer. A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 403-410, IEEE Computer Society, 1991.

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