Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer. A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 403-410, IEEE Computer Society, 1991.
@inproceedings{ChengDK91:0,
title = {A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits},
author = {Kwang-Ting Cheng and Srinivas Devadas and Kurt Keutzer},
year = {1991},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/ChengDK91%3A0},
cites = {0},
citedby = {0},
pages = {403-410},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}