Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights

Eric Cheng, Jacob A. Abraham, Pradip Bose, Alper Buyuktosunoglu, Keith A. Campbell, Deming Chen, Chen-Yong Cher, Hyungmin Cho, Binh Le, Klas Lilja, Shahrzad Mirkhani, Kevin Skadron, Mircea Stan, Lukasz G. Szafaryn, Christos Vezyrtzis, Subhasish Mitra. Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. In 2017 IEEE International Conference on Computer Design, ICCD 2017, Boston, MA, USA, November 5-8, 2017. pages 593-596, IEEE Computer Society, 2017. [doi]

Abstract

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