Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology

Kwang-Ting Cheng, Srinivas Devadas, Kurt Keutzer. Robust Delay-Fault Test Generation and Synthesis for Testability Under A Standard Scan Design Methodology. In DAC. pages 80-86, 1991. [doi]

Abstract

Abstract is missing.