Da Cheng, Sandeep K. Gupta. A systematic methodology to improve yield per area of highly-parallel CMPs. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 126-133, IEEE Computer Society, 2012. [doi]
Abstract is missing.