Maximizing Yield per Area of Highly Parallel CMPs Using Hardware Redundancy

Da Cheng, Sandeep K. Gupta. Maximizing Yield per Area of Highly Parallel CMPs Using Hardware Redundancy. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(10):1545-1558, 2014. [doi]

@article{ChengG14-3,
  title = {Maximizing Yield per Area of Highly Parallel CMPs Using Hardware Redundancy},
  author = {Da Cheng and Sandeep K. Gupta},
  year = {2014},
  doi = {10.1109/TCAD.2014.2334298},
  url = {http://dx.doi.org/10.1109/TCAD.2014.2334298},
  researchr = {https://researchr.org/publication/ChengG14-3},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {33},
  number = {10},
  pages = {1545-1558},
}