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Da Cheng, Sandeep K. Gupta. Maximizing Yield per Area of Highly Parallel CMPs Using Hardware Redundancy. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(10):1545-1558, 2014. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A systematic methodology to improve yield per area of highly-parallel CMPsDa Cheng, Sandeep K. Gupta. dft 2012: 126-133 [doi] Characterization of granularity and redundancy for SRAMs for optimal yield-per-areaJae Chul Cha, Sandeep K. Gupta. iccd 2008: 219-226 [doi] HYPER: A Heuristic for Yield/Area imProvEment Using Redundancy in SoCMohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta. ats 2010: 249-254 [doi]
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