PPB: Partially-working processors binning for maximizing wafer utilization

Da Cheng, Sandeep K. Gupta. PPB: Partially-working processors binning for maximizing wafer utilization. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

Abstract

Abstract is missing.