Kuo-Liang Cheng, Chia-Ming Hsueh, Jing-Reng Huang, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu. Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 91-96, IEEE Computer Society, 2001. [doi]
Abstract is missing.