Chang-Hsin Cheng, Chun-Lung Hsu, Chung-Kai Liu, Shih-Yin Lin. High reliability built-in self-detection and self-correction design for DCT/IDCT application. In IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011. pages 213-218, IEEE, 2011. [doi]
Abstract is missing.