Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug

Yun Cheng, Huawei Li, Ying Wang 0001, Xiaowei Li 0001. Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(4):767-779, 2019. [doi]

Abstract

Abstract is missing.