Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST - researchr publication

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Kwang-Ting Cheng, Chih-Jen Lin. Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 506-514, IEEE Computer Society, 1995.

Abstract is missing.

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