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Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen. Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 1710-1711, IEEE, 2020. [doi]

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