Ming Cheng, Xiaochun Li 0001, David C. Keezer. A Data-Driven Approach to Online Fault Detection in RRAM-Based Neuromorphic Hardware Using Adversarial-Inspired Test. IEEE Trans. VLSI Syst., 34(6):1953-1964, June 2026. [doi]
No references recorded for this publication.
No citations of this publication recorded.