A Data-Driven Approach to Online Fault Detection in RRAM-Based Neuromorphic Hardware Using Adversarial-Inspired Test

Ming Cheng, Xiaochun Li 0001, David C. Keezer. A Data-Driven Approach to Online Fault Detection in RRAM-Based Neuromorphic Hardware Using Adversarial-Inspired Test. IEEE Trans. VLSI Syst., 34(6):1953-1964, June 2026. [doi]

Abstract

Abstract is missing.