Yun Cheng, Huawei Li, Ying Wang, Yingke Gao, Bo Liu, Xiaowei Li 0001. Flip-flop clustering based trace signal selection for post-silicon debug. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.