Wafer Defect Pattern Classification with Explainable-Decision Tree Technique - researchr publication authors

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Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai. Wafer Defect Pattern Classification with Explainable-Decision Tree Technique. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 549-553, IEEE, 2022. [doi]

This author has not been identified. Look up 'Ken Chau-Cheung Cheng' in GoogleThis author has not been identified. Look up 'Katherine Shu-Min Li' in GoogleThis author has not been identified. Look up 'Sying-Jyan Wang' in GoogleThis author has not been identified. Look up 'Andrew Yi-Ann Huang' in GoogleThis author has not been identified. Look up 'Chen-Shiun Lee' in GoogleThis author has not been identified. Look up 'Leon Li-Yang Chen' in GoogleThis author has not been identified. Look up 'Peter Yi-Yu Liao' in GoogleThis author has not been identified. Look up 'Nova Cheng-Yen Tsai' in Google

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