Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer. On Cyclic Scan Integrity Tests for EDT-based Compression. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.