Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion - researchr publication authors

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Hui-Jun Cheng, Jyh-Da Wei, Chun-Yuan Lin, Jin Ye. Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 50(5):1850-1864, 2020. [doi]

This author has not been identified. Look up 'Hui-Jun Cheng' in GoogleThis author has not been identified. Look up 'Jyh-Da Wei' in GoogleThis author has not been identified. Look up 'Chun-Yuan Lin' in GoogleThis author has not been identified. Look up 'Jin Ye' in Google

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