Hui-Jun Cheng, Jyh-Da Wei, Chun-Yuan Lin, Jin Ye. Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 50(5):1850-1864, 2020. [doi]
Abstract is missing.