Hui-Jun Cheng, Jyh-Da Wei, Chun-Yuan Lin, Jin Ye. Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 50(5):1850-1864, 2020. [doi]
@article{ChengWLY20,
title = {Detecting Seam-Carved Image by Extreme Learning Machines Using Patch Analysis Method, Jury Voting, and Combinatorial Fusion},
author = {Hui-Jun Cheng and Jyh-Da Wei and Chun-Yuan Lin and Jin Ye},
year = {2020},
doi = {10.1109/TSMC.2018.2789460},
url = {https://doi.org/10.1109/TSMC.2018.2789460},
researchr = {https://researchr.org/publication/ChengWLY20},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {50},
number = {5},
pages = {1850-1864},
}