Yong-Sheng Cheng, Zhi-qiang You, Ji-shun Kuang. Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 308-313, IEEE Computer Society, 2008. [doi]
Abstract is missing.